Design for Testability

          Design for Testability course is offered to ECE B.Tech students of IV Year in the I semester. Design for Testability is a name for design techniques that add certain testability features to a microelectronic hardware product design. The premise of the added features is that they make it easier to develop and apply manufacturing tests for the designed hardware. The purpose of manufacturing tests is to validate that the product hardware contains no defects that could, otherwise, adversely affect the product’s correct functioning. Tests are applied at several steps in the hardware manufacturing flow and, for certain products, may also be used for hardware maintenance in the customer’s environment. The tests generally are driven by test programs that execute in Automatic Test Equipment (ATE) or, in the case of system maintenance, inside the assembled system itself. In addition to finding and indicating the presence of defects (i.e., the test fails), tests may be able to log diagnostic information about the nature of the encountered test fails. The diagnostic information can be used to locate the source of the failure. Testability plays an important role in the development of test programs and as an interface for test application and diagnostics.

           The development of VLSI technology, coupled with the demand for more signal processing integrated on a single chip, has resulted in an increased need for the design for testability of effective Digital Integrated Circuits. It is clear that Digitalcircuits and systems have an important role in the implementation and application of VLSI technology. This course has been designed to provide a state-of-the-art review of the principles, concepts and techniques needed to carry out the test on Digital Systems. To expose participants to the methods used in the processing and design of circuits. To combine an academic viewpoint with practical examples and experience from industry.